Sloan Dektak II Profilometer Scan Head

Product Information

Introducing the Sloan Dektak II Profilometer Scan Head. This piece of laboratory equipment allows for the precise measurement and analysis of surface topography, making it a key tool in nanotechnology research, semiconductor manufacturing, and material science. Despite being for parts or not working, this equipment boasts exceptional features such as advanced scanning capabilities, precise measurement accuracy, and compatibility with various sample types. With the Sloan Dektak II Profilometer Scan Head, researchers can unlock invaluable insights into surface morphology, roughness, and wear, paving the way for groundbreaking advancements in nanotechnology and material engineering. ***NOT WORKING (Does not turn on)***

• Advanced scanning capabilities
• High measurement accuracy
• Compatibility with various sample types

• Make: Sloan
• Model: Dektak II
• Current Condition: For parts or not working
• Intended Use: Surface topography measurement and analysis
• Weight: 30 kg
• Dimensions: 17 x 10 x 14 cm
• Product Voltage: Not specified
• Product Serial Number: 02652-11/85

Metric: 30 kg
Imperial: 66.14 lbs

Metric: 17 cm x 10 cm x 14 cm
Imperial: 6.69 in x 3.94 in x 5.51 in

902730

Instruments and apparatus for physical or chemical analysis - Profilometers