Perkin Elmer PHI 40-700 XPS X-ray Photoelectron Spectrometer

Product Information

The Perkin Elmer PHI 40-700 XPS X-ray Photoelectron Spectrometer is a marvel of scientific instrumentation, built to exacting standards and maintained in peak condition. It was purchased from RBD Instruments in 2010 for $82,500 and is still backed by their exceptional service. This system was specifically used to detect small PPM level metallic contaminants in injection molded plastic parts, making it a crucial tool in industrial quality control processes. It has further applications in semiconductor and microelectronics, microcircuits, ultra-thin films, soldering, cleaning, barrier layers, corrosion, and various research settings. The system includes advanced components such as a 10-360 hemispherical analyzer with single channel detector, an ion source with control, dual anode 15kV x-ray source, XYZ specimen stage, Dell PC with AugerScan 3.2 software, and more.

• 10-360 Hemispherical Analyzer with Single Channel Detector (SCD)
• 04-300 5kV Differentially Pump Ion Source w/ control, argon bottle and leak valve
• 04-500 Dual Anode 15kV X-ray Source and Controls
• RBD 147 PC Interface and cables
• Sample Load Lock
• Turbo Pumping Station (Turbo Pump, Control and Roughing Pump)
• Integrated Dell PC with RBD AugerScan 3.2 Software Installed & Windows XP OS

• Product Category: Spectrometer - Single Well
• Make: Perkin Elmer
• Model: PHI 40-700 XPS X-ray Photoelectron Spectrometer
• Manufacturing Year: 2010
• Current Condition: Used, Serviced through RBD Instruments
• Working Condition: Yes
• Voltage: 240V, Hertz: 60Hz US
• Weight: 1200 kg (2645 lbs)
• Dimensions: Metric - 36cm x 80cm x 72cm, Imperial - 14.17in x 31.5in x 28.35in

Metric: 1200 kg
Imperial: 2645 lbs

Metric: 36 cm x 80 cm x 72 cm
Imperial: 14.17 in x 31.5 in x 28.35 in

902730

90273000 - Spectrometers, spectrophotometers and spectrographs using optical radiations (UV, visible, IR)