Digital Instruments Dimension 3100 Atomic Force Microscopy (AFM)
- Make Digital Instruments
- Hertz 60Hz US
- Model Dimension 3100
- Serial N/A
- Weight 1150.0 Lb
- Voltage 120V
- Includes Power cord included |
- Warranty 30-Day Warranty, 100% Parts and Labor
- Dimensions 45.0in x 46.0in x 60.0in
- Shipping Type FedEx Ground
- Item Condition Excellent
- Manufacturing Date Does Not Apply
Product Information
Welcome to the world of atomic force microscopy (AFM) with the Digital Instruments Dimension 3100. This high-resolution scanning probe microscope offers sub-nanometer resolution, revealing the intricate nano-landscape of samples. Experience the power of AFM with contact and tapping modes, conductive AFM, STM, and liquid cell capabilities. While this unit does not include the controller and software, it still provides exceptional insight into sample surfaces. Perfect for nanotechnology, material science, and biological applications.
Key Features- High-resolution scanning probe microscope
- Contact and tapping mode AFM
- Conductive AFM
- STM capabilities
- Liquid cell compatibility
- Sample size: 150 mm diameter, 12 mm thick
- Stage movement x-y: 150 mm with 2 micron resolution
- Video optics with zoom: 150-675 micron viewing area
- Piezo scan head range: 90 micron x-y, 6 micron in z
- 16 bits DAC giving sub-nanometer resolution
- Max 512 x 512 samples/image
Metric: 521.63 kg
Imperial: 1150 lbs
Metric: 35.56 cm x 36.83 cm x 50.8 cm
Imperial: 14 in x 14.5 in x 20 in
901180
Harmonized Code DetailsMicroscopes other than optical; diffraction apparatus
Testimonials
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