Digital Instruments Dimension 3100 Atomic Force Microscopy (AFM)
Digital Instruments Dimension 3100 Atomic Force Microscopy (AFM)
Digital Instruments Dimension 3100 Atomic Force Microscopy (AFM)
Digital Instruments Dimension 3100 Atomic Force Microscopy (AFM)
Digital Instruments Dimension 3100 Atomic Force Microscopy (AFM)
Digital Instruments Dimension 3100 Atomic Force Microscopy (AFM)
Digital Instruments Dimension 3100 Atomic Force Microscopy (AFM)
Digital Instruments Dimension 3100 Atomic Force Microscopy (AFM)
Digital Instruments Dimension 3100 Atomic Force Microscopy (AFM)
Digital Instruments Dimension 3100 Atomic Force Microscopy (AFM)

Digital Instruments Dimension 3100 Atomic Force Microscopy (AFM)

sku: 3367422
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Condition : Excellent
Warranty : 30-Day Warranty, 100% Parts and Labor
Region : US
$15,000.00
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  • Make Digital Instruments
  • Hertz 60Hz US
  • Model Dimension 3100
  • Serial N/A
  • Weight 1150.0 Lb
  • Voltage 120V
  • Includes Power cord included |
  • Warranty 30-Day Warranty, 100% Parts and Labor
  • Dimensions 45.0in x 46.0in x 60.0in
  • Shipping Type FedEx Ground
  • Item Condition Excellent
  • Manufacturing Date Does Not Apply

Product Information

Welcome to the world of atomic force microscopy (AFM) with the Digital Instruments Dimension 3100. This high-resolution scanning probe microscope offers sub-nanometer resolution, revealing the intricate nano-landscape of samples. Experience the power of AFM with contact and tapping modes, conductive AFM, STM, and liquid cell capabilities. While this unit does not include the controller and software, it still provides exceptional insight into sample surfaces. Perfect for nanotechnology, material science, and biological applications.

Key Features

  • High-resolution scanning probe microscope
  • Contact and tapping mode AFM
  • Conductive AFM
  • STM capabilities
  • Liquid cell compatibility
Specifications

  • Sample size: 150 mm diameter, 12 mm thick
  • Stage movement x-y: 150 mm with 2 micron resolution
  • Video optics with zoom: 150-675 micron viewing area
  • Piezo scan head range: 90 micron x-y, 6 micron in z
  • 16 bits DAC giving sub-nanometer resolution
  • Max 512 x 512 samples/image
Weight

Metric: 521.63 kg
Imperial: 1150 lbs

Dimensions

Metric: 35.56 cm x 36.83 cm x 50.8 cm
Imperial: 14 in x 14.5 in x 20 in

Harmonized Code

901180

Harmonized Code Details

Microscopes other than optical; diffraction apparatus

Testimonials

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“REUZEit has been a great partner for our used equipment needs and always provide timely updates of new arrivals of consigned equipment.”

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“Great company to work with. Tammy completed our first international equipment shipment with ease.”

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“Fast response, open to adjusting schedule as needed, and great customer interaction.”

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